Low-loss 4500 V/5000 A IGBT modules for flexible DC converter applications
Keywords:
Self-aligned N-type enhancement layer; Large area cells; IGBT crimping module; Short circuit safe operating area; Reverse bias safe operating area;Abstract
In order to meet the application requirements of the ever-increasing transmission capacity of flexible DC converters, high-power and low-loss IGBT modules for power grids have become a development trend. This paper introduces a 4 500 V/5 000 A IGBT module. Through the large-area IGBT cell design of self-aligned N-type enhancement layer, the static and dynamic performance of the multi-chip parallel press-fit module is improved. The terminal structure of P and N field limiting rings plus multi-level field plates ensures the high withstand voltage and low leakage of the module, and optimizes the chip process to adapt to the press-fit packaging requirements. The saturation voltage drop (V CEsat ) of the packaged 4 500 V/5 000 A IGBT press-fit module at room temperature is 2.4 V; at a high temperature of 125°C, V CEsat is 3.12 V, and the leakage current between the collector and the emitter is only 18.78 mA. When the frequency is 100-150 Hz, the total static and dynamic losses are about 2% lower than those of competing products, and the module has passed the short-circuit safe operating area test, reverse bias shutdown safe operating area test and reverse bias test at 125°C.References
[1] Design of 4500 V FRD with low leakage and high softness [J]. Gao Dongyue, Zhang Dahua, Ye Fengye, Zhou Donghai, Luo Jian, Chen Yingyi. Research and Progress in Solid-State Electronics . 2023(01)
[2] 3300 V IGBT module with low leakage and strong short-circuit capability [J]. Gao Dongyue, Ye Fengye, Zhang Dahua, Luo Jian, Gao Jinwen. Research and Progress in Solid-State Electronics . 2022(02)
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2024-12-03
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Copyright (c) 2024 Gao Dongyue, Maple Leaf, Zhang Dahua (Author)

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Low-loss 4500 V/5000 A IGBT modules for flexible DC converter applications. (2024). Guti Dianzixue Yanjiu Yu Jinzhan Research and Progress of Solid State Electronics, 44(2). https://www.rpsse.com/index.php/journal/article/view/11
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